Spectroscopic Ellipsometry: This system is best to measure the real-time or in-line thickness or reflective index monitoring. Spectroscopic ellipsometry is a Windows based system which can be installed with great ease. The system can easily monitor the film thickness and reflective index up to 12 layers.
Spectroscopic Reflectometer: This is also a Windows based system which is equipped with an array based detector system that ensures quick thickness measurement. It can easily measure thickness and reflective index up to 5 layers.
Microspectrophotometry: This system is best to monitor the thick coatings over a micron region area as well as to describe optical properties of thin films. The best thing about micro spectrophotometry is that these systems are portable as well as cost-effective.
If you also want to measure the film or coating thickness, then you can avail any of the above mentioned system. There are various companies which are selling high quality and highly functional thickness measurement tools at affordable rates. You can easily find these companies by spending a few hours online and conduct research for the same.
