There exist many kinds of optical solutions which illustrate the thickness of a thin film and thick coating thickness. They are also helpful in studying the surface and interface behavior of a thin film. A film’s optical properties like refractive index which is denoted by letter N and extinction coefficient i.e. K can also be explained by these solutions. The concentrations of an alloy and its consistency across the surface are also determined with the help of solutions provided. For those looking for film gauge thickness measuring equipments can go for devices meant for this purpose. Such devices allow to record film thickness and refractive index up to 5 layers thick. The tools are easy to arrange and control as Windows based software is used in it which is understood by most of the people. And this makes the interface of these equipments similar to the operating system.
The film thickness gauge measures the dimension of a variety of geometrical substances up to 300mm in diameter. It also computes various types of mapping patterns such as polar, linear, square and random coordinates. It has a detector system too which accelerates the film thickness measurement process. The tool with advanced optics is designed in a way that it greatly contributes in enhancing its system performance.
To study the optical properties of a thin film, a device named Microspectrophotometer is used. Same properties are studied for thick coatings over a micron region. Other names of this device are microreflectometer, micro-reflectometer, microspectrometer, microphotometer (Spectroscopic), microspectroscopic photometer etc. A UV visible spectrophotometer is used as it covers from DUV to infrared ranges. The selection of range depends on several factors like thickness of thin film, thick coating and appropriate wavelength range for reflectance or transmittance.
This UV visible spectrophotometer is easy to operate as it also has Window based software. It’s convenient to use setup and small table top design makes it most preferable and increases its performance. This apparatus allows obtaining reflection, transmission and absorption spectra in milliseconds. It is also suitable to use for real time spectra and refractive index supervision. The system comes with complete optical constants database and library for its user. It also facilitates user to use NK table or composite model (EMA) for individual film. The thickness up to 200mm of size can be measured using this.
Other than this, it has an integrated vision, spectrum and simulation system. In addition, it is equipped with latest imaging software that calulates angle, distance, area and particle count. This device has 2D and 3D output graphics as well and a number of options are also available for special applications
For more details visit: http://goarticles.com/article/With-the-Help-of-Optical-Solutions-Thin-Film-Thickness-Can-Be-Determined/7296853/
The film thickness gauge measures the dimension of a variety of geometrical substances up to 300mm in diameter. It also computes various types of mapping patterns such as polar, linear, square and random coordinates. It has a detector system too which accelerates the film thickness measurement process. The tool with advanced optics is designed in a way that it greatly contributes in enhancing its system performance.
To study the optical properties of a thin film, a device named Microspectrophotometer is used. Same properties are studied for thick coatings over a micron region. Other names of this device are microreflectometer, micro-reflectometer, microspectrometer, microphotometer (Spectroscopic), microspectroscopic photometer etc. A UV visible spectrophotometer is used as it covers from DUV to infrared ranges. The selection of range depends on several factors like thickness of thin film, thick coating and appropriate wavelength range for reflectance or transmittance.
This UV visible spectrophotometer is easy to operate as it also has Window based software. It’s convenient to use setup and small table top design makes it most preferable and increases its performance. This apparatus allows obtaining reflection, transmission and absorption spectra in milliseconds. It is also suitable to use for real time spectra and refractive index supervision. The system comes with complete optical constants database and library for its user. It also facilitates user to use NK table or composite model (EMA) for individual film. The thickness up to 200mm of size can be measured using this.
Other than this, it has an integrated vision, spectrum and simulation system. In addition, it is equipped with latest imaging software that calulates angle, distance, area and particle count. This device has 2D and 3D output graphics as well and a number of options are also available for special applications
For more details visit: http://goarticles.com/article/With-the-Help-of-Optical-Solutions-Thin-Film-Thickness-Can-Be-Determined/7296853/
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