There exist lots of kinds of optical solutions which illustrate the thickness of a narrow film and thick coating thickness. They are also helpful in studying the surface and interface behavior of a narrow film. These include thin film measurement system and UV visible spectrophotometer. A film's optical properties like refractive index which is denoted by letter N and extinction coefficient i.e. K may even be explained by these solutions. The concentrations of an alloy and its consistency across the surface are also determined with the help of solutions provided.
For those looking for film gauge thickness measuring equipments can go for devices meant for this purpose. Such devices permit to record film thickness and refractive index up to five layers thick. The tools are simple to arrange and control as Windows based application is used in it which is understood by most people. And this makes the interface of these equipments similar to the operating method. The familiar look and feel makes it easy for users.
To study the optical properties of a narrow film, a gizmo named Micro spectrophotometer is used. Same properties are studied for thick coatings over a micron region. Other names of this gizmo are microreflectometer, micro-reflectometer, micro spectrometer, micro photometer (Spectroscopic), micro spectroscopic photometer etc. A UV visible spectrophotometer is used as it covers from DUV to infrared ranges. The choice of range depends on several factors like thickness of narrow film, thick coating and appropriate wavelength range for reflectance or transmittance.
This UV visible spectrophotometer is simple to operate as it also has Window based application. It is convenient to make use of setup and small table top design makes it most preferable and increases its performance. This equipment allows obtaining reflection, transmission and absorption spectra in milliseconds. It is also suitable to make use of for actual time spectra and refractive index supervision. The method comes with complete optical constants database and library for its user. It also facilitates user to make use of NK table or composite model (EMA) for individual film. The thickness up to 200mm of size can be measured using this.
Other than this, it's an integrated vision, spectrum and simulation method. In addition, it is equipped with latest imaging application that calculates angle, distance, area and particle count. This gizmo has 2D and 3D output graphics as well and a considerable number of options are also available for special applications.
For more details visit: http://goarticles.com/article/Thin-Film-Measurement-System-for-Optimal-Results/7458678/
For those looking for film gauge thickness measuring equipments can go for devices meant for this purpose. Such devices permit to record film thickness and refractive index up to five layers thick. The tools are simple to arrange and control as Windows based application is used in it which is understood by most people. And this makes the interface of these equipments similar to the operating method. The familiar look and feel makes it easy for users.
To study the optical properties of a narrow film, a gizmo named Micro spectrophotometer is used. Same properties are studied for thick coatings over a micron region. Other names of this gizmo are microreflectometer, micro-reflectometer, micro spectrometer, micro photometer (Spectroscopic), micro spectroscopic photometer etc. A UV visible spectrophotometer is used as it covers from DUV to infrared ranges. The choice of range depends on several factors like thickness of narrow film, thick coating and appropriate wavelength range for reflectance or transmittance.
This UV visible spectrophotometer is simple to operate as it also has Window based application. It is convenient to make use of setup and small table top design makes it most preferable and increases its performance. This equipment allows obtaining reflection, transmission and absorption spectra in milliseconds. It is also suitable to make use of for actual time spectra and refractive index supervision. The method comes with complete optical constants database and library for its user. It also facilitates user to make use of NK table or composite model (EMA) for individual film. The thickness up to 200mm of size can be measured using this.
Other than this, it's an integrated vision, spectrum and simulation method. In addition, it is equipped with latest imaging application that calculates angle, distance, area and particle count. This gizmo has 2D and 3D output graphics as well and a considerable number of options are also available for special applications.
For more details visit: http://goarticles.com/article/Thin-Film-Measurement-System-for-Optimal-Results/7458678/
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