Measure Film Thickness with Spectroscopic Reflectometry and Ellipsometry devices

A spectroscopic Reflectometer measures the film thickness, light intensities on curved samples with smooth or rough surface. The reason for using this technology is because results are made simple, and it is a cost-effective technique. Film thickness or coating plays a vital role in process control, product quality and cost control.

The SR300 Spectroscopic Reflectometer & Film Thickness measurement system is a useful tool for measuring light intensities. Not only, the thickness you can also determine refractive index, reflection, transmission and absorption of thin films and coatings. If you're looking for spectroscopic reflectometry device then look no further, this is the equipment you should consider.

Some of the features of this device are explained to fully understand the functionality of this system. The software installed is windows based that makes it simple to setup and operate. It has an array based detector system to ensure fast measurement. With this tool measure film thickness up to five layers. This device is normally seen in industries that require semiconductor fabrication, liquid crystal display, forensics, semiconductor compounds and more.

If you're looking out for an accurate thin film measurement technique, SRM300 is the perfect device. Everyone is familiar with the windows-based software and with the familiar look and feel you get accustomed to these new tools easily. This film thickness gauge can handle almost all categories in the geometry substrate up to 300mm in diameter and also mapping patterns like linear, polar, square or even arbitrary coordinates. It also has a uniquely designed light source for better intensity and stability.
Spectroscopic ellipsometry (SE) is a technique used to determine thin film thickness, investigate surface determine optical constants, and interface phenomenon and many other physical, chemical and optical properties of materials.

The E200BA Ellipsometer gauges the refractive index and also to determine thickness of semi-transparent thin films. It is easy to setup and operate this window based software. The purpose of using a ellipsometer is that it can measure layers as thin as 1 nm up to layers, which are several microns thick. External optics are not required if you require precise sample alignment interface from the sample signal directly. It has the capability to be used for real time or in-line thickness and refractive index monitoring. There are three different user level controls. The Engineer mode, system service mode and easy user mode It is a fully automatic device that calibrates and initializes systems, manual help is not needed.


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Importance of Spectroscopic Reflectometry

Ellipsometry is a technique used in the investigation of complex refractive index or dielectric function properties of thin films. Classification of optical constants and thickness of organic thin film is the primary method of determining these quantities. Spectroscopic ellipsometry and spectroscopic reflectometry are optical techniques that are flexible and are used to determine the optical and physical properties of a wide variety of thin-film materials such as silicon oxide, silicon, nitride and, even metal films.

In spectroscopic reflectometry reflected light intensities are measured with a broadband wavelength range. Non-polarized light is used at normal incidence. The main advantage of spectroscopic reflectometry is its low-cost and simplicity. Spectroscopic Ellipsometry is the measurement of the state of polarization before and after reflection to determine the properties of reflecting boundaries. This is an integral part of the metrology system and has its application in the semiconductor industry.

Measuring film thickness can be done using different instruments. One such way is with the SRM300 film thickness gauge. Film thickness or coating is an essential variable in process control, product quality and cost control. SRM300 is one of the most efficient thin film thickness measurement techniques that you can find in the market these days. Not only, the film thickness will you be able to know the refractive index up to five layers thick with a single mouse click. If you're worried on how hard, it will be for you to understand the software, don't worry it has a simple setup and is easy to operate.

The first step in this whole process is to understand the equipment used for film thickness measurement and its functionality for every coating operation. The SRM300 uses a window based software that most people are familiar with. The array based detector system guarantees the fastest film thickness measurement. The wavelength range varies from 400 to 1050nm.

Microspectrometry is designed to measure the spectrum of microscopic areas and is used to distinguish optical properties of a thin lens. They are configured to measure the absorbance, transmittance, reflectance, polarization and fluorescence of sample areas as small as a micron. Don't get confused microspectrometry is also known as microreflectometer, micro-reflectometer, microspectrometer, microphotometer (Spectroscopic), microspectroscopic photometer. With its unique design, the user can enjoy digital imaging capability by live video, powerful digital editing and lots of others features. It also covers deep-ultraviolet (DUV) to near-infrared ranges. Thickness ranges depend on several factors like wavelength range of interest for reflectance or transmittance and so on.

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