When we talk about the tools and equipment which are ideal for the task, then the most reliable one is spectroscopic ellipsometers. The best thing about this device is that it is a Windows based system which is easy to operate as well as measures refractive index and film thickness up to 12 layers. Further, to give operational effectiveness, the device comes with three different user level control, i.e., engineer mode, system service mode and easy user mode.
Apart from the above, you can also rely on various other tools and devices which include Micro spectrophotometer, SR Mapping system, TFProbe software and many others. All these devices are ideal for measuring the film thickness and can measure the film thickness and refractive index from 5 layers to 12 layers.
If you are also planning to buy any best device for the purpose, then it is recommended to buy from any renowned manufacturer. You can conduct a primary online research to find out the trusted manufacturer. Using any popular search engine like Google, Yahoo, Bing, etc. would be appreciated as they will provide you access to some of the really good manufacturers of such devices.
